Authors: Clement Fermin, Martin Bisset and Vincent Dorcet
Contacts: Vincent Dorcet (vincent.dorcet@univ-rennes1.fr) and Philippe Boullay (philippe.boullay@ensicaen.fr)
Source: The source EXTRAX_.java is included in the EXTRAX_.jar archive.
Installation: Transfer EXTRAX_.jar to the plugins folder and start ImageJ.
There will be a new "EXTRAX" command in the Plugins menu.
Description: This plugin is used for image processing and analysis in microscopy.
EXTRAX allows measuring intensities from Electron Diffraction spots patterns with a semi-automatic peak location based on a 2D lattice given by the user.
It also includes the possibility to take into account supplementary spots originating from High Order Laue Zones (HOLZ) and/or the existence of satellite spots linked to incommensurate phases.

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You can find all the informations to use this plugin in the article “EXTRAX : an ImageJ plug-in for electron diffraction intensity extraction”, V. Dorcet, X. Larose, C. Fermin, M. Bissey and P. Boullay, Journal of Applied Crystallography Vol.43 Part 1 (2010). Please cite this article if you use this plugin.

History: 2009/12/01: First version


This work was carried out in the frame of the SONDE project supported by the French National Research Agency (ANR) and the council of the region Basse-Normandie.

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